Abstract: The increasing integration density of resistive random access memory (RRAM) arrays leads to a consequential rise in the significance of electro-thermal and parasitic effects in crossbar ...
One way of viewing efforts by storage suppliers to move into data management over the past couple of years is that storage technology is emerging from the backroom and wants to be at the centre of ...
Abstract: DRAM memory reliability is increasingly a concern as recent studies found. In this letter, we propose RAIMD (Redundant Array of Independent Memory Devices ...
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