Scan is a structured test approach in which the overall function of an integrated circuit (IC) is broken into smaller structures and tested individually. Every state element (D flip-flop or latch) is ...

In a huge software project for an embedded application, a function behaved in a strange fashion. A variable, which must not be changed while the function is executed, was changed. The function itself ...

Debugging a large system with many power rails can be challenging. However, don’t panic, a PMBus design combined with good software tools can make the job much easier. In this post we will look at a ...

Adding assertions early and throughout the ASIC design cycle is the best way to independently check that design code reflects the intended behavior as specified in design specifications and the ...